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Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
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The fractional Talbot effect in differential x-ray phase-contrast imaging for extended and polychromatic x-ray

M Engelhardt1, C Kottler, O Bunk

  • 1Siemens AG, München, Germany. martin.engelhardt@mytum.de

Journal of Microscopy
|November 20, 2008
PubMed

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