Model-free classification of X-ray scattering signals applied to image segmentation

V Lutz-Bueno1, C Arboleda1,2, L Leu3,4

  • 1Paul Scherrer Institut, 5232 Villigen PSI, Switzerland.

Journal of Applied Crystallography
|October 4, 2018
PubMed
Summary

This study introduces a model-free method to classify small-angle and wide-angle X-ray scattering (SAXS/WAXS) signals, simplifying the analysis of complex heterogeneous samples without prior knowledge.

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