Numerical method for high accuracy index of refraction estimation for spectro-angular surface plasmon resonance systems

An eigenvector analysis based algorithm is presented for estimating refractive index changes from 2-D reflectance/dispersion images obtained with spectro-angular surface plasmon resonance systems. High resolution over a large dynamic range can be achieved simultaneously. The method performs well in simulations with noisy data maintaining an error of less than 10(-8) refractive index units with up to six bits of noise on 16 bit quantized image data. Experimental measurements show that the method results in a much higher signal to noise ratio than the standard 1-D weighted centroid dip finding algorithm.