Related Experiment Video
Updated: Jun 27, 2026

10:21
Evanescent Field Based Photoacoustics: Optical Property Evaluation at Surfaces
Published on: July 26, 2016
Numerical method for high accuracy index of refraction estimation for spectro-angular surface plasmon resonance
Colin J Alleyne1, Andrew G Kirk, Wei-Yin Chien
1Photonics Systems Group, McGill University, 853 Sherbrooke St., Montréal, Québec, H3A 2T6, Canada.
Optics Express
|November 26, 2008
Summary
This study introduces an eigenvector analysis algorithm for precise refractive index change estimation using spectro-angular surface plasmon resonance imaging. The novel method achieves high resolution and signal-to-noise ratio, even with noisy data.
Area of Science:
- Optics and Photonics
- Materials Science
- Nanotechnology
Background:
- Surface Plasmon Resonance (SPR) is a label-free technique for detecting refractive index changes.
- Traditional SPR methods often struggle with simultaneous high resolution and large dynamic range.
- Existing algorithms may have limitations in signal-to-noise ratio (SNR) and robustness to data noise.
Purpose of the Study:
- To develop a novel algorithm for accurate refractive index change estimation.
- To improve resolution and dynamic range in SPR measurements.
- To enhance the signal-to-noise ratio compared to conventional methods.
Main Methods:
- An eigenvector analysis based algorithm was developed.
- The algorithm processes 2-D reflectance/dispersion images from spectro-angular SPR systems.
- Simulations were performed with varying levels of noise (up to six bits on 16-bit data).
Main Results:
- The algorithm accurately estimates refractive index changes.
- High resolution and a large dynamic range are achieved simultaneously.
- Simulated noisy data yielded an error of less than 10^-8 refractive index units.
- Experimental measurements demonstrated a significantly higher SNR than the standard 1-D weighted centroid dip finding algorithm.
Conclusions:
- The eigenvector analysis algorithm offers superior performance for SPR-based refractive index sensing.
- This method provides a robust and high-fidelity approach for analyzing SPR data.
- The technique is suitable for applications requiring precise and sensitive refractive index measurements.

