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Updated: Jun 27, 2026

Femtosecond Laser Filaments for Use in Sub-Diffraction-Limited Imaging and Remote Sensing
Published on: April 25, 2019
Distance measurements by combined method based on a femtosecond pulse laser
Ki-Nam Joo1, Yunseok Kim, Seung-Woo Kim
1Mechatronic System Design, Department of Precision and Microsystems Engineering, Delft University of Technology, Delft, The Netherlands. k.joo@tudelft.nl
Abstract:
We describe a combined interferometric scheme that enables absolute distance measurements using a femtosecond pulse laser. This method is combined with synthetic wavelength interferometry (SWI), time of flight (TOF) and spectrally-resolved interferometry (SRI) using the optical comb of femtosecond laser. Each technique provides distinct measuring resolutions and ambiguity ranges which are complementary to each other. These separate measurement principles are incorporated and implemented simultaneously and the unified output can enhance the dynamic range of the measuring system. Our experimental results demonstrate an example of absolute distance measurement with the proposed technique and we discuss the possibility of the combined method to measure long distances and the important factors for the implementation.
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