Phase Contrast and Differential Interference Contrast Microscopy
Computed Tomography
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Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
Published on: April 1, 2020
K Rajan1, V Vijayakumar, Samir Kumar Biswas
1Department of Physics, Indian Institute of Science, Bangalore 560012, India. rajan@physics.iisc.ernet.in
This study demonstrates a phase array system for diffuse optical tomography (DOT) to detect small tissue inhomogeneities. The system successfully identifies multiple inhomogeneities as small as 4 mm, offering a promising tool for noninvasive medical imaging.
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