Calibration and characterization of single photon counting cameras for short-pulse laser experiments

The x-ray photon counting efficiency of various charged-coupled device (CCD) based cameras was studied as a function of photon energy and exposure. A pair of Spectral Instruments model 800 CCD cameras fitted with 16 microm thick back-illuminated CCDs were calibrated at low x-ray energy using two well established histogram methods. In addition, two new thick substrate CCDs were evaluated for use at high energy. One was a commercially available Princeton Instruments PI-LCX1300 deep depletion CCD camera, while the other used a custom designed 650 microm thick partially depleted CCD fitted to a Spectral Instruments model 800 camera body. It is shown that at high x-ray energy, a pixel-summing algorithm is necessary to reconstruct the x-ray spectra in the thicker substrate CCDs. This paper will describe the different algorithms used to extract spectra and the absolute detection efficiencies using these algorithms. These detectors and algorithms will be very useful in detecting high-energy x-ray photons from high-intensity short-pulse laser interactions.