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UV–Vis Spectrometers01:14

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Direct Imaging of Laser-driven Ultrafast Molecular Rotation
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Published on: February 4, 2017

Extreme-ultraviolet polarimeter utilizing laser-generated high-order harmonics.

Nicole Brimhall1, Matthew Turner, Nicholas Herrick

  • 1Department of Physics and Astronomy, Brigham Young University, Provo, Utah 84602, USA.

The Review of Scientific Instruments
|December 3, 2008
PubMed
Summary
This summary is machine-generated.

This study presents a novel extreme-ultraviolet (EUV) polarimeter using laser-generated harmonics. The instrument accurately characterizes materials and thin films for EUV applications.

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Area of Science:

  • Optics and Photonics
  • Materials Science
  • Laser Physics

Background:

  • Characterizing materials for extreme-ultraviolet (EUV) applications requires specialized optical instruments.
  • Existing EUV sources often lack the precise polarization control and broad wavelength coverage needed for detailed material analysis.

Purpose of the Study:

  • To develop and demonstrate an EUV polarimeter utilizing laser-generated high-order harmonics.
  • To enable accurate characterization of materials and thin films within the 14-30 nm wavelength range.

Main Methods:

  • Generation of EUV light via high-order harmonics from laser pulses.
  • Measurement of reflectance over a continuous range of incident angles (5°-75°).
  • Utilizing a gas cell for controlled attenuation and a microchannel plate detector system.

Main Results:

  • The polarimeter achieved a spectral resolution of approximately 180 (λ/Δλ).
  • Reflectance measurements were performed across a 14-30 nm wavelength range.
  • Data obtained from the EUV polarimeter showed strong agreement with synchrotron-based measurements.

Conclusions:

  • Laser-generated high-order harmonics provide a versatile and controllable EUV light source for polarimetry.
  • The developed EUV polarimeter is a valuable tool for material and thin-film characterization in the EUV spectrum.
  • This instrument offers a viable alternative to traditional EUV characterization methods, with high spectral resolution and angular tunability.