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Updated: Jun 27, 2026

Atomic Force Microscopy of Red-Light Photoreceptors Using PeakForce Quantitative Nanomechanical Property Mapping
Published on: October 24, 2014
Yongho Seo1, C S Choi, S H Han
1Faculty of Nanotechnology and Advanced Material Engineering and Institute of Fundamental Physics, Sejong University, Seoul 143-747, Republic of Korea. yseo@sejong.ac.kr
Researchers developed a real-time atomic force microscope using a novel "microscanner." This innovation enables high-speed imaging, achieving 30 frames per second for observing dynamic nano-objects like poly(ethylene-oxide).
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