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Related Concept Videos

Super-resolution Fluorescence Microscopy01:37

Super-resolution Fluorescence Microscopy

Super-resolution fluorescence microscopy (SRFM) provides a better resolution than conventional fluorescence microscopy by reducing the point spread function (PSF). PSF is the light intensity distribution from a point that causes it to appear blurred. Due to PSF, each fluorescing point appears bigger than its actual size, and it is the PSF interference of nearby fluorophores that causes the blurred image. Various approaches to achieving higher resolution through SRFM have recently been developed.
X-ray Imaging01:24

X-ray Imaging

German physicist Wilhelm Röntgen (1845–1923) was experimenting with electrical current when he discovered that a mysterious and invisible "ray" would pass through his flesh but leave an outline of his bones on a screen coated with a metal compound. In 1895, Röntgen made the first durable record of the internal parts of a living human: an "X-ray" image (as it came to be called) of his wife’s hand. Scientists worldwide quickly began their own experiments with X-rays, and by 1900, X-ray was widely...
Transmission Electron Microscopy01:15

Transmission Electron Microscopy

In 1931, physicist Ernst Ruska—building on the idea that magnetic fields can direct an electron beam just as lenses can direct a beam of light in an optical microscope—developed the first prototype of the electron microscope. This development led to the development of the field of electron microscopy. In the transmission electron microscope (TEM), electrons are produced by a hot tungsten element and accelerated by a potential difference in an electron gun, which gives them up to 400 keV in...
X-ray Diffraction of Biological Samples01:10

X-ray Diffraction of Biological Samples

X-ray diffraction or XRD is an analytical tool that utilizes X-rays to study ordered structures such as crystalline organic and inorganic samples, polycrystalline materials, proteins, carbohydrates, and drugs.
According to Bragg's law, when X-rays strike the sample positioned on a stage, the rays are  scattered by the electron clouds around the sample atoms. The  X-ray diffraction or scattering is caused by constructive interference of the X-ray waves that reflect off the internal crystal...
Overview of Electron Microscopy01:25

Overview of Electron Microscopy

The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.
X-ray Crystallography02:18

X-ray Crystallography

The size of the unit cell and the arrangement of atoms in a crystal may be determined from measurements of the diffraction of X-rays by the crystal, termed X-ray crystallography.
Diffraction
Diffraction is the change in the direction of travel experienced by an electromagnetic wave when it encounters a physical barrier whose dimensions are comparable to those of the wavelength of the light. X-rays are electromagnetic radiation with wavelengths about as long as the distance between neighboring...

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Related Experiment Video

Updated: Jun 27, 2026

Non-invasive 3D-Visualization with Sub-micron Resolution Using Synchrotron-X-ray-tomography
08:51

Non-invasive 3D-Visualization with Sub-micron Resolution Using Synchrotron-X-ray-tomography

Published on: May 27, 2008

High resolution hard x-ray microscope on a second generation synchrotron source.

Yangchao Tian1, Wenjie Li, Jie Chen

  • 1National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei Anhui 230029, People's Republic of China. ychtian@ustc.edu.cn

The Review of Scientific Instruments
|December 3, 2008
PubMed
Summary
This summary is machine-generated.

A new transmission x-ray microscope (TXM) offers 50 nm resolution for nanoscale imaging. This powerful tool is ideal for biology, materials, and environmental science research.

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Related Experiment Videos

Last Updated: Jun 27, 2026

Non-invasive 3D-Visualization with Sub-micron Resolution Using Synchrotron-X-ray-tomography
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Published on: May 27, 2008

Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
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Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples

Published on: June 19, 2018

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08:46

Using Synchrotron Radiation Microtomography to Investigate Multi-scale Three-dimensional Microelectronic Packages

Published on: April 13, 2016

Area of Science:

  • X-ray microscopy
  • Materials Science
  • Nanotechnology

Background:

  • Second-generation synchrotron sources present challenges in photon flux.
  • High-resolution imaging is crucial for nanoscale scientific studies.

Purpose of the Study:

  • To report the installation and characterization of a new transmission x-ray microscope (TXM).
  • To evaluate the TXM's performance for nanoscale imaging applications.

Main Methods:

  • Installation of a full-field transmission x-ray microscope (TXM) at the National Synchrotron Radiation Laboratory.
  • Operation in the 7-11 keV energy range using absorption or Zernike phase contrast modes.
  • Characterization of beamline properties, source characteristics, and optical components.

Main Results:

  • Achieved high-quality x-ray images with spatial resolution down to 50 nm.
  • Demonstrated effective operation in both absorption and Zernike phase contrast modes.
  • Despite low photon flux, acceptable exposure times were achieved.

Conclusions:

  • The new TXM is a valuable analytical tool for nanoscale phenomena and structural imaging.
  • The TXM supports diverse scientific fields including biology, materials science, and environmental science.
  • Future plans include improving the TXM's throughput.