Exploration of the ultimate patterning potential achievable with focused ion beams

J Gierak1, E Bourhis, G Faini

  • 1LPN/CNRS, Route de Nozay, F-91460 Marcoussis, France. jacques.gierak@lpn.cnrs.fr

Ultramicroscopy
|December 3, 2008
PubMed

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