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Atomically Traceable Nanostructure Fabrication
Published on: July 17, 2015
What silicon nanocluster is most likely formed in etching experiments? Theoretical DFT study
Nurbosyn U Zhanpeisov1, Hiroshi Fukumura
1Department of Chemistry, Graduate School of Science, Tohoku University, Sendai 980-8578, Japan.
Journal of Nanoscience and Nanotechnology
|December 5, 2008
Summary
This study identifies the most probable silicon nanocluster structure, Si35H36, formed during electrochemical etching. Calculations confirm its stability and complete hydrogen termination, indicating a defect-free nanostructure.
Area of Science:
- Computational materials science
- Nanotechnology
- Physical chemistry
Background:
- Silicon nanoclusters are crucial for nanomaterials and electronics.
- Understanding their formation and structure is vital for controlling properties.
- Electrochemical etching is a common method for producing silicon nanoclusters.
Purpose of the Study:
- To determine the most probable structure of silicon nanoclusters formed by electrochemical etching.
- To investigate the structural, energetic, and electronic properties of these nanoclusters.
- To provide theoretical support for experimental findings.
Main Methods:
- Density functional theory (DFT) calculations at the B3LYP/6-31G* level.
- Time-dependent DFT (TDDFT) for estimating absorption spectra.
- Analysis of various functionals and basis sets for representative cluster models.
Main Results:
- The Si35H36 nanocluster is identified as the most probable structure.
- Calculations support the formation of a stable, H-terminated nanostructure.
- The absence of defects like Si-Si dimers and short H...H contacts was confirmed.
Conclusions:
- The Si35H36 nanocluster is the favored structure in electrochemical etching experiments.
- The theoretical findings align with experimental observations.
- The study provides insights into the atomic-level structure and stability of silicon nanoclusters.

