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Modified Fabry-Perot interferometric method for waveguide loss measurement.

Sareh Taebi¹, Mohammadreza Khorasaninejad, Simarjeet Singh Saini

¹Department of Electrical and Computer Engineering, University of Waterloo, Waterloo, Ontario, Canada.

|December 17, 2008

Summary

This study presents an improved Fabry-Perot interferometric method to simultaneously measure optical loss and reflectivity in waveguides. The technique uses a broadband source and curve fitting, simplifying measurements and enhancing accuracy, especially for short waveguides.

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Area of Science:

Optoelectronics
Photonics
Materials Science

Background:

Accurate measurement of optical loss and reflectivity is crucial for optical waveguide characterization.
Traditional methods can be complex and sensitive to variations in input power and cavity reflections.

Purpose of the Study:

To develop an extended Fabry-Perot interferometric method for simultaneous optical loss and reflectivity calculation in optical waveguides.
To simplify the measurement procedure by using a broadband source and curve fitting for input power variations.

Main Methods:

Utilizing a broadband amplified spontaneous emission source (superluminescent diode) for waveguide excitation.
Implementing curve fitting to compensate for changes in input power during measurement.
Measuring waveguides of varying lengths to enable simultaneous determination of optical loss and reflectivity.

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Main Results:

The extended method allows for simultaneous measurement of optical loss and reflectivity over multiple wavelengths.
The technique demonstrates decreased sensitivity to cavity reflections compared to tunable laser methods.
Assuming reflectivity values can lead to significant errors in loss measurements, particularly for short waveguides.

Conclusions:

The developed Fabry-Perot interferometric method offers a simplified and more accurate approach for simultaneous optical loss and reflectivity determination.
This method is robust and applicable to generic cases where input power fluctuations are a concern.
Accurate reflectivity measurement is essential for precise optical loss quantification in waveguides.