[XPS analysis of tea plant leaf and root surface]

Jiang-yu Fang1, Xiao-chun Wan

  • 1Postdoctoral Research Station in Horticulture, Anhui Agricultural University, Hefei 230036, China. fjy@hsu.edu.cn

Summary

X-ray Photoelectron Spectroscopy (XPS) reveals distinct surface chemistry for tea plant leaves and roots. Roots exhibit higher activity and aluminum content, suggesting enhanced absorption capabilities.

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