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Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
Published on: October 11, 2016
1Paul Scherrer Institut, 5232 Villigen PSI, Switzerland. ian.johnson@psi.ch
A new X-ray detector system enables advanced X-ray photon correlation spectroscopy (XPCS) studies. This system measures temporal fluctuations in diffraction patterns, offering insights into material dynamics across Hz to kHz frequencies.
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