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Tetracene film morphology: comparative atomic force microscopy, X-ray diffraction and ellipsometry investigations

B Gompf1, D Faltermeier, C Redling

  • 11. Physikalisches Institut, Universität Stuttgart, Pfaffenwaldring 57, D-70550 Stuttgart, Germany. gompf@pi1.physik.uni-stuttgart.de

The European Physical Journal. E, Soft Matter
|December 24, 2008
PubMed
Summary

This study investigates tetracene thin films using X-ray diffraction and microscopy. Researchers established an interdigitated growth mode, revealing insights into film morphology and reaction products.

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