Search research articles

ABOUT JoVE

Overview Leadership Blog JoVE Help Center

AUTHORS

Publishing Process Editorial Board Scope & Policies Peer Review FAQ Submit

LIBRARIANS

Testimonials Subscriptions Access Resources Library Advisory Board FAQ

RESEARCH

JoVE Journal Methods Collections JoVE Encyclopedia of Experiments Archive

EDUCATION

JoVE Core JoVE Business JoVE Science Education JoVE Lab Manual Faculty Resource Center Faculty Site

Terms & Conditions of Use

Related Concept Videos

Electron Microscope Tomography and Single-particle Reconstruction

Electron Microscope Tomography and Single-particle Reconstruction

Transmission electron microscopy (TEM) can be used to determine the 3D structure of biological samples with the help of techniques such as electron microscope tomography and single-particle reconstruction. While single-particle reconstruction can examine macromolecules and macromolecular complexes in vitro conditions only, tomography permits the study of cell components or small cells in vivo.
Electron Tomography
Electron tomography can be performed either in TEM or STEM (scanning transmission...

Three-Dimensional Microscopy in Microbiology

Three-Dimensional Microscopy in Microbiology

Three-dimensional imaging techniques are essential in cell biology, allowing researchers to visualize intricate cellular structures with high resolution. Two prominent methods, Differential Interference Contrast Microscopy (DIC) and Confocal Scanning Laser Microscopy (CSLM), provide distinct advantages for imaging live and thick specimens, respectively.Differential Interference Contrast MicroscopyDIC microscopy enhances contrast in transparent, unstained samples by converting phase...

Overview of Electron Microscopy

Overview of Electron Microscopy

The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.

Transmission Electron Microscopy

Transmission Electron Microscopy

In 1931, physicist Ernst Ruska—building on the idea that magnetic fields can direct an electron beam just as lenses can direct a beam of light in an optical microscope—developed the first prototype of the electron microscope. This development led to the development of the field of electron microscopy. In the transmission electron microscope (TEM), electrons are produced by a hot tungsten element and accelerated by a potential difference in an electron gun, which gives them up to 400 keV in...

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by

Same author

Evaluation of Gas Formation and Consumption Driven by Crossover Effect in High-Voltage Lithium-Ion Batteries with Ni-Rich NMC Cathodes.

ACS applied materials & interfaces·2019

Same author

New Functionality of Ionic Liquids as Lubricant Additives: Mitigating Rolling Contact Fatigue.

ACS applied materials & interfaces·2019

Same author

Palladium Nanoparticle-Enabled Ultrathick Tribofilm with Unique Composition.

ACS applied materials & interfaces·2018

Same author

Strain-Driven Stacking Faults in CdSe/CdS Core/Shell Nanorods.

The journal of physical chemistry letters·2018

Same author

Subtractive fabrication of ferroelectric thin films with precisely controlled thickness.

Nanotechnology·2018

Same author

Rapid Diffusion and Nanosegregation of Hydrogen in Magnesium Alloys from Exposure to Water.

ACS applied materials & interfaces·2017

Search research articles

Related Experiment Video

Updated: Jun 26, 2026

Energy Dispersive X-ray Tomography for 3D Elemental Mapping of Individual Nanoparticles

Energy Dispersive X-ray Tomography for 3D Elemental Mapping of Individual Nanoparticles

Published on: July 5, 2016

Three-dimensional electron microscopy of individual nanoparticles.

Konrad Jarausch¹, Donovan N Leonard

¹Hitachi High-Technologies Corporation, Pleasanton, CA 94588, USA. konradjarausch@yahoo.com

Journal of Electron Microscopy

|December 26, 2008

Summary

Researchers developed a new protocol for 3D analysis of nanoparticles using a customized electron microscope rotation holder. This method enables detailed structural and chemical characterization of nanomaterials, advancing nanotechnology research.

More Related Videos

Single Particle Electron Microscopy Reconstruction of the Exosome Complex Using the Random Conical Tilt Method

Single Particle Electron Microscopy Reconstruction of the Exosome Complex Using the Random Conical Tilt Method

Published on: March 28, 2011

Correlative Microscopy for 3D Structural Analysis of Dynamic Interactions

Correlative Microscopy for 3D Structural Analysis of Dynamic Interactions

Published on: June 24, 2013

Related Experiment Videos

Last Updated: Jun 26, 2026

Energy Dispersive X-ray Tomography for 3D Elemental Mapping of Individual Nanoparticles

Energy Dispersive X-ray Tomography for 3D Elemental Mapping of Individual Nanoparticles

Published on: July 5, 2016

Single Particle Electron Microscopy Reconstruction of the Exosome Complex Using the Random Conical Tilt Method

Single Particle Electron Microscopy Reconstruction of the Exosome Complex Using the Random Conical Tilt Method

Published on: March 28, 2011

Correlative Microscopy for 3D Structural Analysis of Dynamic Interactions

Correlative Microscopy for 3D Structural Analysis of Dynamic Interactions

Published on: June 24, 2013

Area of Science:

Nanotechnology
Materials Science
Electron Microscopy

Background:

Advanced characterization of 3D nanomaterials is crucial for nanotechnology development.
Existing methods face limitations in analyzing complex nanoparticle structures and chemistries.

Purpose of the Study:

To present a novel protocol for optimizing rotation holders for 3D structural and chemical analysis of nanoparticles.
To enable detailed characterization of nanoparticle morphology, properties, and composition in three dimensions.

Main Methods:

Combined focused ion beam (FIB) milling, thin film deposition, and solution chemistry to customize rotation holder stubs.
Utilized scanning transmission electron microscope (STEM)/transmission electron microscope (TEM) with a rotation holder for 3D imaging.
Employed electron energy-loss spectroscopy (EELS) spectrum imaging for chemical analysis and tomography for 3D reconstruction.

Main Results:

Successfully optimized rotation holder stubs for 3D STEM analysis of core-shell nanoparticles.
Characterized individual core-shell nanoparticle morphology, optoelectronic properties, and chemical composition in 3D.
Eliminated missing wedge artifacts through 360-degree rotation imaging and determined local material properties using EELS.

Conclusions:

The developed protocol facilitates comprehensive 3D structural and chemical analysis of nanoparticles.
This approach minimizes substrate effects by cantilevered nanoparticle analysis over vacuum.
The protocol is adaptable for 3D TEM/STEM analysis of diverse nanomaterial systems.