Development of a scanning surface probe for nanoscale tip-enhanced desorption/ablation

Area of Science:

• Materials Science
• Surface Science
• Nanotechnology

Background:

• Scanning probe techniques are crucial for nanoscale analysis.
• Opaque substrates pose challenges for surface characterization.
• High-resolution chemical imaging requires precise surface interaction.

Purpose of the Study:

• To develop a versatile scanning apparatus for nanoscale surface sampling.
• To utilize laser-induced desorption/ablation for material removal.
• To enable high-resolution chemical imaging of opaque materials.

Main Methods:

• A scanning apparatus employing laser radiation focused at a sharp probe tip.
• Desorption/ablation of opaque substrates using focused laser interaction.
• Demonstration with both metal-coated and bare silicon tips.

Main Results:

• Achieved surface craters as small as approximately 50 nm in diameter and 5 nm deep.
• Demonstrated the process on both metal-coated and bare silicon tips.
• Observed desorption/ablation below the optical far-field threshold.

Conclusions:

• The developed apparatus offers versatile nanoscale surface sampling capabilities.
• The laser-induced desorption/ablation process is effective on opaque substrates.
• The method's resolution is not limited by the optical far-field threshold, supporting chemical imaging applications.