SVD-based evaluation of multiplexing in multipinhole SPECT systems

Aaron K Jorgensen1, Gengsheng L Zeng

  • 1Department of Electrical and Computer Engineering, University of Utah, Salt Lake City, UT 84112, USA. aaron.jorgensen@utah.edu

Summary

This study introduces a new figure of merit for predicting single-photon emission computed tomography (SPECT) system performance, moving beyond trial-and-error design. This objective method, based on singular value decomposition, correlates well with simulations for multipinhole SPECT systems.

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