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Updated: Jun 26, 2026

Tuning a Parallel Segmented Flow Column and Enabling Multiplexed Detection
Published on: December 15, 2015
SVD-based evaluation of multiplexing in multipinhole SPECT systems
Aaron K Jorgensen1, Gengsheng L Zeng
1Department of Electrical and Computer Engineering, University of Utah, Salt Lake City, UT 84112, USA. aaron.jorgensen@utah.edu
This study introduces a new figure of merit for predicting single-photon emission computed tomography (SPECT) system performance, moving beyond trial-and-error design. This objective method, based on singular value decomposition, correlates well with simulations for multipinhole SPECT systems.
Area of Science:
- Medical Imaging
- Nuclear Medicine
- Systems Engineering
Background:
- Multipinhole single-photon emission computed tomography (SPECT) system design traditionally relies on empirical, trial-and-error methods.
- Predicting the precise performance of a multipinhole SPECT system before physical testing is challenging.
- Optimization of multipinhole SPECT systems would benefit from an objective, non-experimental evaluation approach.
Purpose of the Study:
- To develop an objective figure of merit for predicting multipinhole SPECT system performance.
- To establish a method that moves beyond traditional experimental evaluation in SPECT system design.
- To provide a more informative metric than the condition number for assessing SPECT system characteristics.
Main Methods:
- Derived a novel figure of merit based on the singular value spectrum of the SPECT system.
- Utilized singular value decomposition (SVD) principles for system performance prediction.
- Compared the proposed figure of merit against simulated performance data for multiple SPECT systems.
Main Results:
- The derived figure of merit demonstrated a strong correlation with simulated SPECT system performance.
- The proposed metric provides more comprehensive information about system performance compared to the condition number.
- The method shows promise for objective evaluation and optimization of multipinhole SPECT systems.
Conclusions:
- The proposed figure of merit is a valuable tool for predicting multipinhole SPECT system performance.
- Further research is needed to enhance the accuracy and applicability of this predictive method.
- The study discusses limitations and suggests avenues for future improvements in SPECT system evaluation.
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