Operation and application of a new time-of-flight e-gas secondary neutral mass spectrometer (ToF-SNMS)
M Kopnarski1, J Lösch, L Simeonov
1Institute for Surface and Thin Film Analysis IFOS, Technical University of Kaiserslautern, 67663, Kaiserslautern, Germany.
Abstract:
The low-pressure rf plasma of a secondary neutral mass spectrometer (e-gas SNMS) was connected with a time-of-flight (ToF) mass spectrometer for the first time. As opposed to ToF-SIMS in e-gas SNMS, the primary ion pulse cannot be used for triggering the flight time measurement. Therefore, an extraction pulse is used which at a defined time loads an ion package from the beam of the post-ionised particles into the ToF spectrometer. The newly developed ToF-SNMS system is described, and first experimental results are presented.
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