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A quantitative assessment of microelectrodes.

Ralf Schlesiger1, Guido Schmitz

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Microelectrodes enhance atom probe tomography performance. Field enhancement measurements confirm finite element calculations, even for larger 50microm electrodes, improving instrument applicability.

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Area of Science:

  • Materials Science
  • Analytical Chemistry
  • Physics

Background:

  • Atom probe tomography (APT) is a powerful nanoscale characterization technique.
  • Microelectrodes have been proposed to enhance APT performance and applicability.
  • Practical limitations restrict microelectrode downscaling to approximately 10 micrometers for stable measurements.

Purpose of the Study:

  • To experimentally measure the field enhancement provided by microelectrodes in APT.
  • To compare experimental results with finite element calculations of electric fields.
  • To assess the impact of microelectrode size on field enhancement.

Main Methods:

  • Utilized the field ion microscopy (FIM) mode to measure field enhancement.
  • Employed microelectrodes with diameters around 10 micrometers.
  • Performed finite element calculations to model electric fields around microelectrodes.
  • Compared experimental data with simulation predictions.

Main Results:

  • Experimental field enhancement measurements showed considerable scattering between individual microelectrodes and specimen tips.
  • On average, experimental data confirmed the predictions from finite element calculations.
  • Even a microelectrode with a 50 micrometer diameter demonstrated a reasonable field enhancement, approximately a factor of two.

Conclusions:

  • Microelectrodes, even at sizes larger than initially proposed, offer measurable field enhancement in APT.
  • Finite element calculations are a reliable tool for predicting electric field behavior around microelectrodes.
  • The findings support the use of microelectrodes to improve APT performance and broaden its applicability.