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Related Concept Videos

Atomic Emission Spectroscopy: Instrumentation01:22

Atomic Emission Spectroscopy: Instrumentation

The instrumentation of atomic emission spectrometry (AES) involves various components, including atomization devices that convert samples into gas-phase atoms and ions. There are two main types of atomization devices: continuous and discrete atomizers.  Continuous atomizers, like plasmas and flames, introduce samples in a constant stream, while discrete atomizers inject individual samples using syringes or autosamplers. The most common discrete atomizer is the electrothermal atomizer.
Atomic Emission Spectroscopy: Overview01:20

Atomic Emission Spectroscopy: Overview

Atomic emission spectroscopy (AES) is an analytical technique used to determine the elemental composition of a sample by analyzing the light emitted from excited atoms. In AES, atoms in a sample are excited to higher energy levels by thermal energy from high-temperature sources, such as plasma, arcs, or sparks. When these excited atoms return to lower energy states, they emit light at specific wavelengths characteristic of each element. The resulting atomic emission spectrum, which consists of...
Super-resolution Fluorescence Microscopy01:37

Super-resolution Fluorescence Microscopy

Super-resolution fluorescence microscopy (SRFM) provides a better resolution than conventional fluorescence microscopy by reducing the point spread function (PSF). PSF is the light intensity distribution from a point that causes it to appear blurred. Due to PSF, each fluorescing point appears bigger than its actual size, and it is the PSF interference of nearby fluorophores that causes the blurred image. Various approaches to achieving higher resolution through SRFM have recently been developed.
X-ray Imaging01:24

X-ray Imaging

German physicist Wilhelm Röntgen (1845–1923) was experimenting with electrical current when he discovered that a mysterious and invisible "ray" would pass through his flesh but leave an outline of his bones on a screen coated with a metal compound. In 1895, Röntgen made the first durable record of the internal parts of a living human: an "X-ray" image (as it came to be called) of his wife’s hand. Scientists worldwide quickly began their own experiments with X-rays, and by 1900, X-ray was widely...
Atomic Emission Spectroscopy: Lab01:29

Atomic Emission Spectroscopy: Lab

AES is a powerful analytical technique, especially effective when used with plasma sources, producing abundant spectra in characteristic emission lines. The Inductively Coupled Plasma (ICP), in particular, yields superior quantitative analytical data due to its high stability, low noise, low background, and minimal interferences under optimal experimental conditions. However, newer air-operated microwave sources are emerging as promising alternatives that could be more cost-effective than...
Electron Microscope Tomography and Single-particle Reconstruction01:07

Electron Microscope Tomography and Single-particle Reconstruction

Transmission electron microscopy (TEM) can be used to determine the 3D structure of biological samples with the help of techniques such as electron microscope tomography and single-particle reconstruction. While single-particle reconstruction can examine macromolecules and macromolecular complexes in vitro conditions only, tomography permits the study of cell components or small cells in vivo.
Electron Tomography
Electron tomography can be performed either in TEM or STEM (scanning transmission...

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Multimodal Nonlinear Hyperspectral Chemical Imaging Using Line-Scanning Vibrational Sum-Frequency Generation Microscopy
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Atomic-resolution spectroscopic imaging: past, present and future.

Stephen J Pennycook1, Maria Varela, Andrew R Lupini

  • 1Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831-6030, USA. pennycooksj@ornl.gov

Journal of Electron Microscopy
|January 23, 2009
PubMed
Summary
This summary is machine-generated.

Atomically resolved electron energy loss spectroscopy has advanced significantly, enabling detailed compositional analysis and spectroscopic imaging. This progress, driven by aberration correction, aims for atomic-resolution mapping of electronic structures within materials.

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Area of Science:

  • Materials Science
  • Spectroscopy
  • Electron Microscopy

Background:

  • Electron energy loss spectroscopy (EELS) is a powerful technique for analyzing material composition and electronic structure.
  • Advancements in aberration correction have been crucial for improving the spatial resolution of electron microscopy techniques.
  • Previous EELS methods were limited in their ability to provide atomic-scale compositional information.

Purpose of the Study:

  • To review the historical development and evolution of atomically resolved EELS.
  • To showcase the progression from basic compositional profiling to advanced spectroscopic imaging.
  • To highlight the impact of aberration correction on analytical sensitivity and image contrast in EELS.

Main Methods:

  • Review of key milestones in the development of EELS instrumentation and methodologies.
  • Analysis of the role of aberration correction in enhancing spatial resolution and signal-to-noise ratio.
  • Presentation of examples demonstrating plane-by-plane, column-by-column, and 2D/3D spectroscopic imaging capabilities.

Main Results:

  • Demonstration of increasing analytical sensitivity and image contrast with successive generations of aberration correction.
  • Establishment of techniques for compositional profiling at the atomic scale.
  • Progress towards full 2D and 3D spectroscopic imaging with atomic resolution.

Conclusions:

  • Atomically resolved EELS has evolved significantly, offering unprecedented detail in material analysis.
  • Aberration correction is a key enabling technology for achieving atomic resolution in EELS.
  • The ultimate goal of mapping electronic structure at the atomic level is increasingly attainable.