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A 3D-printed Chamber for Organic Optoelectronic Device Degradation Testing
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A 3D-printed Chamber for Organic Optoelectronic Device Degradation Testing

Published on: August 10, 2018

Electrical characterization of N- and P-doped hole and electron only organic devices

Tae Jin Park1, Sun Young Kim, Woo Sik Jeon

  • 1Advanced Display Research Center and Department of Information Display, Kyung Hee University, Dongdaemoon-ku, Seoul 130-701, Korea.

Journal of Nanoscience and Nanotechnology
|February 10, 2009
PubMed

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