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Simple method for determination of the thickness of a nonabsorbing thin film using spectral reflectance measurement

Jiri Lunácek1, Petr Hlubina, Milena Lunácková

  • 1Department of Physics, Technical University of Ostrava, 17 listopadu 15, Ostrava-Poruba 70833, Czech Republic. jiri.lunacek@vsb.cz

Applied Optics
|February 12, 2009
PubMed

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