X-ray Crystallography
Determination of Crystal Structures
Imperfections in Crystal Structure: Stoichiometric Point Defects
Imperfections in Crystal Structure: Point, Line and Plane Defects
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Updated: Jun 25, 2026

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
Published on: May 28, 2016
1Department of Applied Physics, Chalmers University of Technology, SE-412 96 Gothenburg, Sweden.
Researchers identified Burgers vectors in mullite using electron diffraction. The study links these vectors, including [112], to the material's structure and oxygen vacancies.
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