Defocus convergent beam electron diffraction analysis of dislocations in mullite

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Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
11:14

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

Published on: May 28, 2016

S Gustafsson1, L K L Falk

  • 1Department of Applied Physics, Chalmers University of Technology, SE-412 96 Gothenburg, Sweden.

Journal of Microscopy
|February 18, 2009
PubMed

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