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Impact of Single pMOSFET Dielectric Degradation on NAND Circuit Performance

D Estrada1, M L Ogas, R G Southwick

  • 1Boise State University, Electrical and Computer Engineering Department, 1910 University Dr., Boise, ID 83725, USA.

Microelectronics and Reliability
|March 4, 2009
PubMed

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