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Updated: Jun 25, 2026

A Basic Positron Emission Tomography System Constructed to Locate a Radioactive Source in a Bi-dimensional Space
Published on: February 1, 2016
2E1 Ar(17+) decay and conventional radioactive sources to determine efficiency of semiconductor detectors
Emily Lamour1, Christophe Prigent, Benjamin Eberhardt
1Université Pierre et Marie Curie-Paris 6, UMR 7588, INSP, 140 rue de Lourmel, Paris F-75015, France. emily.lamour@insp.jussieu.fr
Abstract:
Although reliable models may predict the detection efficiency of semiconductor detectors, measurements are needed to check the parameters supplied by the manufacturers, namely, the thicknesses of dead layer, beryllium window, and crystal active area. The efficiency of three silicon detectors has been precisely investigated in their entire photon energy range of detection. In the zero to a few keV range, we developed a new method based on the detection of the 2E1 decay of the metastable Ar(17+) 2s-->1s transition. Very good theoretical knowledge of the energetic distribution of the 2E1 decay mode enables precise characterization of the absorbing layers in front of the detectors. In the high-energy range (>10 keV), the detector crystal thickness plays a major role in the detection efficiency and has been determined using a (241)Am source.
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