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Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay Method
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Bound electronic and free carrier nonlinearities in Silicon nanocrystals at 1550nm

R Spano1, N Daldosso, M Cazzanelli

  • 1Nanoscience Laboratory, Dipartimento di Fisica, Università di Trento, Via Sommarive 14, I-38050 Povo-Trento,Italy. spano@science.unitn.it

Optics Express
|March 5, 2009
PubMed

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