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Probing Surface Electrochemical Activity of Nanomaterials using a Hybrid Atomic Force Microscope-Scanning Electrochemical Microscope (AFM-SECM)
Published on: February 10, 2021
Chenggang Zhou1, Jinping Wu, Liang Chen
1Institute of Theoretical Chemistry and Computational Materials Science, China University of Geosciences, Wuhan 430074, China.
A new atomic force field accurately simulates copper clusters and nanoparticles. This computational tool is fast and reliable for various structures, aiding molecular dynamics simulations.
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