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Published on: May 3, 2019
Single-turn extraction from a K110 AVF cyclotron by flat-top acceleration.
Satoshi Kurashima1, Nobumasa Miyawaki, Susumu Okumura
1Takasaki Advanced Radiation Research Institute, Japan Atomic Energy Agency, 1233 Watanuki, Takasaki, Gunma 370-1292, Japan. kurashima.satoshi@jaea.go.jp
Japan Atomic Energy Agency achieved single-turn extraction using flat-top (FT) acceleration, enhancing ion beam quality for microbeam applications. This method significantly reduces beam energy spread and boosts cyclotron extraction efficiency.
Area of Science:
- Nuclear Physics and Accelerator Technology
- Particle Beam Manipulation
- Microbeam Formation
Background:
- The Japan Atomic Energy Agency's AVF cyclotron (K=110) requires improved ion beam characteristics for microbeam applications.
- Existing extraction methods limit energy spread reduction and extraction efficiency.
- Flat-top (FT) acceleration is a promising technique to enhance beam quality.
Purpose of the Study:
- To implement single-turn extraction using a flat-top (FT) acceleration system in the AVF cyclotron.
- To reduce the energy spread of ion beams for microbeam formation.
- To increase the extraction efficiency of the cyclotron.
Main Methods:
- Designed and implemented a FT resonator using MAFIA code, operating at the fifth-harmonic frequency (55-110 MHz).
- Coupled the FT resonator to the main resonator via a coupling capacitor.
- Accelerated various ion beams (e.g., 220 MeV Carbon, 260 MeV Neon, 45 MeV Hydrogen) using FT acceleration with harmonic modes h=1 and h=2.
- Observed clear turn separation of beam bunches at the extraction region for over 200 revolutions.
- Confirmed single-turn extraction using a beam chopping system.
- Measured energy spread using an analyzing magnet.
Main Results:
- Achieved high extraction efficiency exceeding 95%.
- Successfully demonstrated single-turn extraction, confirmed by beam bunch counting.
- Reduced the energy spread of a 260 MeV Neon beam from ΔE/E=0.1% to 0.05% via FT acceleration and single-turn extraction.
- Observed clear beam bunch separation at the extraction region.
Conclusions:
- Single-turn extraction with FT acceleration effectively reduces ion beam energy spread.
- The developed FT resonator is compact, power-efficient, and covers the required frequency range.
- This technique significantly enhances extraction efficiency and beam quality for microbeam applications.
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