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Related Experiment Video

Updated: Jun 23, 2026

Dynamic Electrochemical Measurement of Chloride Ions

Dynamic Electrochemical Measurement of Chloride Ions

Published on: February 5, 2016

Measuring changes in surface potential as two charged bodies approach in electrolyte solution.

Elad Greenfield¹, Uri Sivan

¹Department of Physics and the Russell Berrie Nanotechnology Institute, Technion-Israel Institute of Technology, Haifa 32000, Israel. eladgr@tx.technion.ac.il

Physical Review Letters

|April 28, 2009

Summary

We developed a novel potentiometer using atomic force microscopy and an ion-sensitive field effect transistor to measure minute surface potential changes. This tool precisely quantifies charge redistribution between surfaces in electrolyte solutions.

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Area of Science:

Surface science
Electrochemistry
Nanotechnology

Background:

Understanding surface potential is crucial for colloid and surface science.
Conventional methods struggle to accurately measure surface potential changes at high resolution.
Interactions between charged surfaces in electrolyte solutions are complex and not fully understood.

Purpose of the Study:

To develop a novel potentiometer for high-resolution surface potential measurements.
To investigate charge redistribution between approaching charged surfaces in electrolyte solutions.
To differentiate electrostatic interactions from other forces like van der Waals and hydration forces.

Main Methods:

Combining atomic force microscopy (AFM) with an ion-sensitive field effect transistor (ISFET).
Developing a novel potentiometric measurement technique.
Analyzing interactions between two silica surfaces in an electrolyte solution.

Main Results:

Achieved measurement of surface potential changes as small as 100 microvolts.
Obtained a spatial resolution of 0.2 nanometers.
Observed significant deviations from indirectly inferred surface potential values using conventional force curve analysis.
Elucidated charge redistribution mechanisms between non-identical surfaces.

Conclusions:

The novel AFM-ISFET potentiometer enables unprecedented precision in surface potential measurements.
Direct measurement provides new insights into charge redistribution dynamics at interfaces.
This technique allows for the clear separation of electrostatic forces from other interaction forces.