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Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
Published on: October 11, 2016
Development of new apertures for coherent X-ray experiments
Eric M Dufresne1, Steven B Dierker, Z Yin
1The Advanced Photon Source, Argonne National Laboratory, Argonne, IL 60439, USA. dufresne@anl.gov
Journal of Synchrotron Radiation
|April 28, 2009
Summary
New X-ray scattering slits minimize background noise by apodizing the beam. This design reduces parasitic diffraction patterns, improving data quality in coherent small-angle X-ray scattering experiments.
Area of Science:
- Physics
- Materials Science
- Optics
Background:
- Coherent small-angle X-ray scattering (CSAXS) experiments require precise spatial filtering of the X-ray beam.
- Fraunhofer diffraction from beam-defining slits is a significant source of background noise in CSAXS.
- Standard slits lead to a background intensity that scales inversely with the square of the wavevector.
Purpose of the Study:
- To design and test novel X-ray slits that minimize parasitic background in CSAXS.
- To develop a theoretical model predicting the diffraction pattern characteristics of the new slit design.
- To experimentally validate the theoretical model using X-ray diffraction measurements.
Main Methods:
- Design of new X-ray slits featuring partially transmitting, inclined slit jaws for beam apodization.
- Development of a theoretical model to predict Fraunhofer diffraction patterns from the novel slits.
- Experimental measurement of Fraunhofer diffraction patterns using 3 and 5.5 keV X-rays with GaAs single-crystal edges.
Main Results:
- The new slit design effectively minimizes parasitic background.
- The theoretical model accurately predicts that the diffraction pattern tails scale with the inverse fourth power of the wavevector.
- A novel phase-peak diffraction pattern, linked to transmitted electric field phase variations, was observed and explained by the model.
Conclusions:
- The developed slit design offers a significant reduction in background noise for CSAXS.
- The theoretical model provides accurate predictions for diffraction patterns, including novel phase phenomena.
- These advancements enhance the precision and reliability of coherent X-ray scattering techniques.
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