Jove
Visualize
Contact Us

Related Concept Videos

Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
Comparison Between Electrical And Gravitational Forces01:24

Comparison Between Electrical And Gravitational Forces

There are four fundamental forces in nature: the gravitational force, the electromagnetic force, the strong nuclear force, and the weak nuclear force. To compare the numerical strengths of the first two, take two particles of the same kind. Since electrons are fundamental particles, they are a good example.
Since both are inverse square law forces, the distance gets canceled when the ratio of the two forces is considered. Instead, the ratio of the electrical and gravitational forces depends on...
Van der Waals Interactions01:24

Van der Waals Interactions

Atoms and molecules interact with each other through intermolecular forces. These electrostatic forces arise from attractive or repulsive interactions between particles with permanent, partial, or temporary charges. The intermolecular forces between neutral atoms and molecules are ion–dipole, dipole–dipole, and dispersion forces, collectively known as van der Waals forces.Polar molecules have a partial positive charge on one end and a partial negative charge on the other end of the molecule,...

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Identification of potential lockdown areas during COVID-19 transmission in Punjab, Pakistan.

Public health·2020
Same author

Measuring contact angle and meniscus shape with a reflected laser beam.

The Review of scientific instruments·2014
Same author

Studying flow close to an interface by total internal reflection fluorescence cross-correlation spectroscopy: quantitative data analysis.

Physical review. E, Statistical, nonlinear, and soft matter physics·2012
Same author

Temperature jump study of charge translocation during the bacteriorhodopsin photocycle.

Biophysical journal·2009
Same author

Measuring electrostatic, van der Waals, and hydration forces in electrolyte solutions with an atomic force microscope.

Biophysical journal·2009
Same author

Measuring local surface charge densities in electrolyte solutions with a scanning force microscope.

Biophysical journal·2009
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Experiment Video

Updated: Jun 23, 2026

Probing Surface Electrochemical Activity of Nanomaterials using a Hybrid Atomic Force Microscope-Scanning Electrochemical Microscope (AFM-SECM)
08:31

Probing Surface Electrochemical Activity of Nanomaterials using a Hybrid Atomic Force Microscope-Scanning Electrochemical Microscope (AFM-SECM)

Published on: February 10, 2021

Electrostatic interaction in atomic force microscopy.

H J Butt1

  • 1Max Planck Institut für Biophysik, Kennedyallee 70, 6000 Frankfurt a.M. 70, Germany.

Biophysical Journal
|May 12, 2009
PubMed
Summary

In atomic force microscopy (AFM), electrostatic forces between the stylus and charged surfaces are comparable to Van der Waals forces. These repulsive electrostatic forces can be managed by adjusting salt concentration or surface potential.

Area of Science:

  • Physics
  • Materials Science
  • Surface Science

Background:

  • Atomic force microscopy (AFM) is a high-resolution surface imaging technique.
  • Imaging in aqueous media introduces electrostatic interactions between the AFM stylus and the charged sample surface.
  • Understanding these forces is crucial for accurate nanoscale measurements.

Purpose of the Study:

  • To numerically calculate the electrostatic force experienced by AFM styli in aqueous environments.
  • To compare the electrostatic force with the Van der Waals force.
  • To investigate methods for controlling or mitigating electrostatic forces during AFM imaging.

Main Methods:

  • Continuum theory was employed for numerical calculations.
  • Simulations were performed for silicon nitride and silicon oxide styli.

More Related Videos

Covalent Attachment of Single Molecules for AFM-based Force Spectroscopy
10:37

Covalent Attachment of Single Molecules for AFM-based Force Spectroscopy

Published on: March 16, 2020

Related Experiment Videos

Last Updated: Jun 23, 2026

Probing Surface Electrochemical Activity of Nanomaterials using a Hybrid Atomic Force Microscope-Scanning Electrochemical Microscope (AFM-SECM)
08:31

Probing Surface Electrochemical Activity of Nanomaterials using a Hybrid Atomic Force Microscope-Scanning Electrochemical Microscope (AFM-SECM)

Published on: February 10, 2021

Covalent Attachment of Single Molecules for AFM-based Force Spectroscopy
10:37

Covalent Attachment of Single Molecules for AFM-based Force Spectroscopy

Published on: March 16, 2020

  • Van der Waals forces were also calculated for comparative analysis.

    • Main Results:

    • The electrostatic force is repulsive, unlike the attractive Van der Waals force.
    • At 0.5 nm separation, electrostatic forces (10^-12 to 10^-10 N) are comparable in magnitude to Van der Waals forces.
    • Electrostatic force increases with surface charge density and decays exponentially with distance.
    • High salt concentrations effectively reduce electrostatic forces.
    • An analytical approximation for electrostatic force is provided for surface potentials below 50 mV.

    Conclusions:

    • Electrostatic forces are a significant factor in AFM imaging in aqueous media.
    • These forces can be modulated by controlling surface charge, distance, and ionic strength.
    • The findings provide a basis for improved AFM operation and data interpretation in liquid environments.