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Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
Van der Waals Interactions01:24

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Atoms and molecules interact with each other through intermolecular forces. These electrostatic forces arise from attractive or repulsive interactions between particles with permanent, partial, or temporary charges. The intermolecular forces between neutral atoms and molecules are ion–dipole, dipole–dipole, and dispersion forces, collectively known as van der Waals forces.Polar molecules have a partial positive charge on one end and a partial negative charge on the other end of the molecule,...

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Imaging of Extracellular Vesicles by Atomic Force Microscopy
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Measuring electrostatic, van der Waals, and hydration forces in electrolyte solutions with an atomic force

H J Butt1

  • 1Max-Planck-Institut für Biophysik, Kennedyallee 70, 6000 Frankfurt a. M. 70, Germany.

Biophysical Journal
|May 12, 2009
PubMed
Summary

Atomic force microscopy reveals repulsive electrostatic forces between charged tips and surfaces in electrolyte solutions, dependent on salt concentration. A separate hydration force was observed at high salt concentrations.

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Investigating Single Molecule Adhesion by Atomic Force Spectroscopy
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Last Updated: Jun 23, 2026

Imaging of Extracellular Vesicles by Atomic Force Microscopy
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Investigating Single Molecule Adhesion by Atomic Force Spectroscopy
09:48

Investigating Single Molecule Adhesion by Atomic Force Spectroscopy

Published on: February 27, 2015

Area of Science:

  • Surface science
  • Atomic force microscopy
  • Physical chemistry

Background:

  • Atomic force microscopy (AFM) involves tip-surface interactions including electrostatic, van der Waals, and hydration forces in electrolyte solutions.
  • Understanding these forces is crucial for accurate imaging of charged surfaces.

Purpose of the Study:

  • To investigate electrostatic interaction forces versus distance curves in electrolyte solutions.
  • To characterize repulsive forces and their dependence on salt concentration, pH, and tip surface charge.
  • To identify and attribute observed repulsive forces to electrostatic and hydration origins.

Main Methods:

  • AFM force-distance curves were recorded using various charged tips (silicon nitride, Al(2)O(3), glass, diamond) on negatively charged surfaces (mica, glass).
  • Experiments were conducted across a range of salt concentrations and pH values.
  • High salt concentrations (>3 M divalent cations) were used to isolate hydration forces.

Main Results:

  • Neutral and negatively charged tips exhibited repulsive forces dependent on salt concentration, decaying exponentially with a length similar to the Debye length.
  • Positively charged tips showed only attractive forces.
  • A distinct repulsive force, attributed to hydration, was observed with silicon nitride tips on mica at high salt concentrations, decaying exponentially with a 3 nm length.

Conclusions:

  • The observed repulsive forces are primarily electrostatic in origin, influenced by salt concentration and tip charge.
  • Hydration forces become significant and observable in the absence of electrostatic interactions at high divalent cation concentrations.
  • AFM is a valuable tool for quantifying and differentiating surface forces in electrolyte environments.