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Related Concept Videos

Metal-Semiconductor Junctions01:24

Metal-Semiconductor Junctions

The contact of metal and semiconductor can lead to the formation of a junction with either Schottky or Ohmic behavior.
Schottky Barriers
Schottky barriers arise when a metal with a work function (Φm) contacts a semiconductor with a different work function (Φs). Initially, electrons transfer until the Fermi levels of the metal and semiconductor align at equilibrium. For instance, if Φm > Φs, the semiconductor Fermi level is higher than the metal's before contact. The semiconductor's...
Biasing of Metal-Semiconductor Junctions01:27

Biasing of Metal-Semiconductor Junctions

Biasing metal-semiconductor junctions involves applying a voltage across the junction. Specifically, the metal is connected to a voltage source, while the semiconductor is grounded. This technique is essential for controlling the direction and magnitude of current flow in electronic devices, including diodes, transistors, and photovoltaic cells.
In Schottky junctions, where the semiconductor is n-type, applying a positive voltage to the metal relative to the semiconductor reduces its Fermi...
Fermi Level Dynamics01:12

Fermi Level Dynamics

The vacuum level denotes the energy threshold required for an electron to escape from a material surface. It is usually positioned above the conduction band of a semiconductor and acts as a benchmark for comparing electron energies within various materials.
Electron affinity in semiconductors refers to the energy gap between the minimum of its conduction band and the vacuum level and it is a critical parameter in determining how easily a semiconductor can accept additional electrons.
The work...
MOSFET01:16

MOSFET

The Metal-Oxide-Semiconductor Field-Effect Transistor (MOSFET) plays a pivotal role in modern electronics thanks to its versatility and efficiency in controlling electrical currents. This device, also known as IGFET, MISFET, and MOSFET, has three main terminals: the Source, Drain, and Gate. MOSFETs are classified into n-channel or p-channel types based on the doping characteristics of their substrate and the source or drain regions.
In an n-MOSFET, the structure includes n-type source and drain...
Types of Semiconductors01:20

Types of Semiconductors

Intrinsic semiconductors are highly pure materials with no impurities. At absolute zero, these semiconductors behave as perfect insulators because all the valence electrons are bound, and the conduction band is empty, disallowing electrical conduction. The Fermi level is a concept used to describe the probability of occupancy of energy levels by electrons at thermal equilibrium. In intrinsic semiconductors, the Fermi level is positioned at the midpoint of the energy gap at absolute zero. When...

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Silicon Metal-oxide-semiconductor Quantum Dots for Single-electron Pumping
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Molecular electronics at metal/semiconductor junctions. Si inversion by sub-nanometer molecular films.

Omer Yaffe1, Luc Scheres, Sreenivasa Reddy Puniredd

  • 1Department of Materials & Interfaces, Weizmann Institute of Science, Rehovot 76100, Israel.

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|May 15, 2009
PubMed
Summary

Electronic transport across semiconductor junctions is largely unaffected by organic layer thickness. This suggests a generation-recombination mechanism, not thermionic emission, dominates charge transport.

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Area of Science:

  • Solid State Physics
  • Materials Science
  • Organic Electronics

Background:

  • Understanding electronic transport in organic/semiconductor interfaces is crucial for device applications.
  • Previous models often assumed thermionic emission as the dominant transport mechanism.
  • The influence of organic layer properties on charge transport requires further investigation.

Purpose of the Study:

  • To investigate the electronic transport properties of n-type silicon/alkyl monolayer/mercury (n-Si/alkyl/Hg) junctions.
  • To determine the dependence of charge transport on the length of the alkyl chains in the organic monolayer.
  • To elucidate the underlying mechanism of electron transport across these interfaces.

Main Methods:

  • Fabrication of n-Si/alkyl/Hg junctions with varying alkyl chain lengths.
  • Electrical characterization of the junctions, including current-voltage (I-V) measurements.
  • Analysis of transport mechanisms under different bias conditions.

Main Results:

  • Electronic transport was found to be independent of alkyl chain length for lengths from 18 down to 1-2 carbons at reverse and low forward bias.
  • Results indicate that electron transport is dominated by minority carriers.
  • The transport mechanism appears to be governed by generation and recombination, not thermionic emission.

Conclusions:

  • The observed insensitivity to interface properties suggests a transport mechanism other than simple thermionic emission.
  • Binding organic molecules directly to semiconductors offers unique control over semiconductor/metal interface properties.
  • Minority carrier transport via generation-recombination is a key factor in these systems.