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Flow-assisted Dielectrophoresis: A Low Cost Method for the Fabrication of High Performance Solution-processable Nanowire Devices
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Noise in ZnO nanowire field effect transistors

Hao D Xiong1, Wenyong Wang, John S Suehle

  • 1Semiconductor Electronics Division, National Institute of Standards and Technology, 100 Bureau Drive, M.S. 8120, Gaithersburg, Maryland 20899-8120, USA.

Journal of Nanoscience and Nanotechnology
|May 16, 2009
PubMed

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