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Related Concept Videos

Transmission Electron Microscopy01:15

Transmission Electron Microscopy

In 1931, physicist Ernst Ruska—building on the idea that magnetic fields can direct an electron beam just as lenses can direct a beam of light in an optical microscope—developed the first prototype of the electron microscope. This development led to the development of the field of electron microscopy. In the transmission electron microscope (TEM), electrons are produced by a hot tungsten element and accelerated by a potential difference in an electron gun, which gives them up to 400 keV in...
Electron Microscope Tomography and Single-particle Reconstruction01:07

Electron Microscope Tomography and Single-particle Reconstruction

Transmission electron microscopy (TEM) can be used to determine the 3D structure of biological samples with the help of techniques such as electron microscope tomography and single-particle reconstruction. While single-particle reconstruction can examine macromolecules and macromolecular complexes in vitro conditions only, tomography permits the study of cell components or small cells in vivo.
Electron Tomography
Electron tomography can be performed either in TEM or STEM (scanning transmission...
Overview of Electron Microscopy01:25

Overview of Electron Microscopy

The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.

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Related Experiment Video

Updated: Jun 23, 2026

Single-Digit Nanometer Electron-Beam Lithography with an Aberration-Corrected Scanning Transmission Electron Microscope
10:25

Single-Digit Nanometer Electron-Beam Lithography with an Aberration-Corrected Scanning Transmission Electron Microscope

Published on: September 14, 2018

Ultra-high resolution nano-characterisation and analysis using advanced S/TEM.

Dominique H W Hubert1, Bert Freitag, Debbie J Stokes

  • 1FEI Company, P.O. Box 80066, 5600 Eindhoven, Netherlands.

Journal of Nanoscience and Nanotechnology
|May 16, 2009
PubMed
Summary
This summary is machine-generated.

Advanced electron microscopy techniques, including aberration-corrected transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM), enable atomic-level analysis. These tools provide ultra-high resolution imaging and spectroscopy for detailed material characterization.

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Related Experiment Videos

Last Updated: Jun 23, 2026

Single-Digit Nanometer Electron-Beam Lithography with an Aberration-Corrected Scanning Transmission Electron Microscope
10:25

Single-Digit Nanometer Electron-Beam Lithography with an Aberration-Corrected Scanning Transmission Electron Microscope

Published on: September 14, 2018

Atomically Traceable Nanostructure Fabrication
12:35

Atomically Traceable Nanostructure Fabrication

Published on: July 17, 2015

Resonance Raman Spectroscopy of Extreme Nanowires and Other 1D Systems
07:44

Resonance Raman Spectroscopy of Extreme Nanowires and Other 1D Systems

Published on: April 28, 2016

Area of Science:

  • Nanotechnology
  • Materials Science
  • Analytical Chemistry

Background:

  • Nanotechnology advancements necessitate higher resolution imaging and analysis tools.
  • Existing methods face limitations in probing materials at the atomic scale.

Purpose of the Study:

  • To explore the capabilities of advanced electron microscopy for ultra-high resolution analysis.
  • To demonstrate the potential for atomic-level characterization of material properties.

Main Methods:

  • Utilizing aberration-corrected transmission electron microscopy (TEM).
  • Employing scanning transmission electron microscopy (STEM) with high electron beam energy resolution.
  • Performing in situ time-resolved structural transformation studies.

Main Results:

  • Achieved sub-angstrom length-scale imaging and atomic-level spectroscopy.
  • Enabled detailed characterization of chemical composition, electronic structure, and mechanical properties.
  • Captured time-resolved structural transformations with sub-nanometer detail.

Conclusions:

  • Advanced electron microscopy techniques are crucial for pushing the frontiers of nanotechnology.
  • These methods provide unprecedented insights into inter-atomic bonding and material dynamics.
  • Direct observation of in situ chemical processes at the nanoscale is now feasible.