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A novel feature selection methodology for automated inspection systems.

Hugo C Garcia1, Jesus Rene Villalobos, Rong Pan

  • 1L3, Electro-Optical Systems, Tempe, AZ 85281, USA. Hugo.Garcia@L-3com.com

Summary

This study introduces a novel feature selection method using misclassification error estimation, reducing computational time for classification algorithms. It offers direct assessment of feature benefits, improving inspection and classification accuracy.

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