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Related Concept Videos

Interference: Path Lengths01:10

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Consider two sources of sound, that may or may not be in phase, emitting waves at a single frequency, and consider the frequencies to be the same.
Two special sources may be considered when they are in phase. This can be easily achieved by feeding the two sources from the same source. An example would be synchronizing the two speakers by feeding them with the same source, such as the sound waves produced by a tuning fork. This setup ensures that the two sources have the same frequency and are...
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In-phase-contrast microscopes, interference between light directly passing through a cell and light refracted by cellular components is used to create high-contrast, high-resolution images without staining. It is the oldest and simplest type of microscope that creates an image by altering the wavelengths of light rays passing through the specimen. Altered wavelength paths are created using an annular stop in the condenser. The annular stop produces a hollow cone of...
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Interference is a characteristic phenomenon exhibited by waves. When two electromagnetic waves interact with their peaks and troughs coinciding, a resulting wave with enhanced amplitude is produced. This is known as constructive interference. In this case, the two waves interacting are in phase with each other.
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Phase-lead controllers are commonly used in various control systems to enhance response speed and stability. Adjusting the brightness on a television screen offers a practical example of phase-lead control. When contrast is enhanced, a phase-lead controller is employed. Mathematically, phase-lead control is identified when the first parameter is smaller than the second.
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Noise in phase shifting interferometry.

M Servin1, J C Estrada, J A Quiroga

  • 1Centro de Investigaciones en Optica A. C., Loma del Bosque 115, 37150 Leon Guanajuato, Mexico. mservin@cio.mx

Optics Express
|May 26, 2009
PubMed
Summary
This summary is machine-generated.

This study introduces a formula to estimate phase noise in Phase Shifting Interferometry (PSI) caused by noisy interferograms. It analyzes how filtering in Electronic Speckle Pattern Interferometry (ESPI) converts multiplicative noise to additive noise, enabling phase noise estimation.

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Area of Science:

  • Optical Metrology
  • Signal Processing
  • Interferometry

Background:

  • Phase Shifting Interferometry (PSI) is susceptible to phase noise originating from noisy interferograms.
  • Electronic Speckle Pattern Interferometry (ESPI) often deals with multiplicative noise that can be transformed by linear filtering.

Purpose of the Study:

  • To develop a theoretical framework for estimating phase noise in PSI.
  • To analyze the impact of linear filtering on noise characteristics in ESPI.
  • To derive a formula for quantifying phase noise in demodulated phase measurements.

Main Methods:

  • Theoretical analysis of phase noise sources in interferometric techniques.
  • Investigation of linear filtering effects on multiplicative noise in ESPI.
  • Derivation of a phase noise power formula based on spectral response and PSI algorithms.

Main Results:

  • A method to estimate phase noise in PSI due to noisy interferograms.
  • Demonstration that linear filtering converts multiplicative noise in ESPI to additive Gaussian noise.
  • A formula to estimate the standard deviation of noisy demodulated phase, dependent on spatial filtering and PSI algorithm.

Conclusions:

  • The derived formula provides a quantitative measure of phase noise in PSI systems.
  • Understanding noise transformation in ESPI through linear filtering is crucial for accurate phase retrieval.
  • The phase noise power formula is a key outcome, applicable to systems employing spatial filtering and PSI.