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Iterative processing of second-order optical nonlinearity depth profiles
Optics Express
|June 2, 2009
Summary
The Fienup algorithm accurately retrieves nonlinearity profiles from Maker-fringe curves for nonlinear optical materials. This method enhances data processing for crystalline, organic, and poled silica samples.
Area of Science:
- Nonlinear optics
- Materials science
- Computational physics
Background:
- Maker-fringe measurements are crucial for characterizing nonlinear optical properties.
- Retrieving accurate nonlinearity profiles from experimental data can be challenging.
- Existing methods like inverse Fourier transform may have limitations.
Purpose of the Study:
- To demonstrate the efficacy of the Fienup algorithm for processing Maker-fringe data.
- To retrieve the nonlinearity profile of nonlinear optical materials.
- To assess the algorithm's accuracy and applicability to various material types.
Main Methods:
- Numerical simulations were performed to test the Fienup algorithm.
- Experimental Maker-fringe data from nonlinear samples were processed.
- The Fienup algorithm was applied iteratively to the measured curves.
Main Results:
- The Fienup algorithm accurately retrieved nonlinearity profiles from simulated and experimental data.
- High accuracy was achieved for profiles with one or two dominant peaks.
- The algorithm proved effective for crystalline, organic, and poled silica nonlinear films.
Conclusions:
- The Fienup algorithm offers a fast, simple, and accurate method for nonlinearity profile retrieval.
- This technique is broadly applicable to various nonlinear optical materials.
- The Fienup algorithm can improve upon existing inverse Fourier transform methods.
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