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High spectral resolution x-ray optics with highly oriented pyrolytic graphite.

H Legall, H Stiel, V Arkadiev

|June 12, 2009

Summary

Highly oriented pyrolytic graphite (HOPG) thin films enable novel crystal optics. These films achieve record spectral resolutions for HOPG, offering high reflectivity for compact X-ray instruments.

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Area of Science:

Materials Science
Optics
Crystallography

Background:

Highly oriented pyrolytic graphite (HOPG) offers unique properties for crystal optics fabrication.
HOPX exhibits high integral reflectivity, significantly exceeding other crystals in the 2-10 keV range.
Its mosaicity allows for shaping into arbitrary geometries for diverse optical applications.

Purpose of the Study:

To investigate the spectral resolution achievable with HOPG thin films for crystal optics.
To evaluate the trade-off between spectral resolution and integral reflectivity in HOPG films.
To demonstrate the potential of HOPG for advanced X-ray diagnostic tools and spectrometers.

Main Methods:

Fabrication of thin HOPG films mounted on molds of various shapes.
Measurement of spectral resolution in first and second order reflections using HOPG crystals.
Determination of integral reflectivity for HOPG films of varying thicknesses.

Main Results:

Achieved spectral resolutions of E/ΔE=2900 (second order) and E/ΔE=1800 (first order) with HOPG crystals.
These resolutions represent the highest reported for HOPG to date.
Integral reflectivity of thin HOPG films remains comparable to ideal Germanium (Ge) crystals.

Conclusions:

Thin HOPG films are suitable for creating highly efficient crystal optics with excellent spectral resolution.
The study demonstrates a clear trade-off between energy resolution and integral reflectivity based on HOPG film thickness.
HOPX holds significant promise for developing compact and high-performance X-ray diagnostic tools and spectrometers.