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Bragg's Law diffraction simulations for electron backscatter diffraction analysis
Josh Kacher1, Colin Landon, Brent L Adams
1Department of Mechanical Engineering, Brigham Young University, 455B Crabtree Technology Building, Provo, UT 84602, USA. jkacherbyu@gmail.com
Ultramicroscopy
|June 13, 2009
Summary
This study introduces an enhanced electron backscatter diffraction (EBSD) method using simulated patterns for precise lattice strain and rotation measurements in materials. The technique achieves high resolution, enabling detailed analysis of polycrystalline alloys.
Area of Science:
- Materials Science
- Crystallography
- Solid Mechanics
Background:
- Electron Backscatter Diffraction (EBSD) is a key microscopy technique for analyzing material microstructures.
- Accurate measurement of lattice rotations and elastic strains is crucial for understanding material behavior.
- Existing cross-correlation EBSD methods face challenges with polycrystalline materials.
Purpose of the Study:
- To develop a novel cross-correlation EBSD method utilizing simulated patterns for high-resolution lattice state analysis.
- To improve the accuracy and applicability of EBSD for measuring elastic strains and rotations.
- To demonstrate the method's utility in characterizing complex material systems.
Main Methods:
- A modified cross-correlation EBSD approach employing Bragg's Law-based simulated patterns as strain-free references.
- Iterative comparison of simulated and collected EBSD patterns to calculate lattice deformation.
- Application to single crystal silicon for angular and elastic strain resolution assessment.
- Analysis of a compressed polycrystalline Mg-based AZ91 alloy to estimate dislocation density.
Main Results:
- Achieved an angular resolution of approximately 0.04 degrees.
- Demonstrated an elastic strain resolution of approximately 7e-4.
- Successfully estimated dislocation density in a polycrystalline alloy using measured elastic strain and curvature.
Conclusions:
- The developed EBSD method offers high precision for lattice strain and rotation analysis.
- The use of simulated reference patterns enhances the applicability to polycrystalline materials.
- This technique provides a valuable tool for materials characterization and failure analysis.
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