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Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
Published on: May 28, 2016
A study of visible defects caused by local cell gap variations in LCD panels
Optics Express
|June 18, 2009
Abstract:
We relate local cell gap variations to visible defects in LCD panels using psychophysical methods of human eye perception of intensity variations. Our analysis is applicable to general shape of cell gap variation for any LCD mode. We use our method in an explicit example to determine the visible cell gap variation threshold for TN LCD panels.
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