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Surface-sensitive reflection-mode EXAFS from layered sample systems: the influence of surface and interface

P Keil¹, D Lützenkirchen-Hecht

¹Department of Interface Chemistry and Surface Engineering, Max-Planck Institut für Eisenforschung GmbH, Max-Planck-Strasse 1, 40237 Düsseldorf, Germany. dirklh@uni-wuppertal.de

Journal of Synchrotron Radiation

|June 19, 2009

Summary

This study quantifies how surface and interface roughness affect reflection-mode grazing-incidence X-ray absorption spectra. Accurate modeling, including roughness, is crucial for analyzing single and multilayered systems like oxidized copper.

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Area of Science:

Surface science
Materials characterization
X-ray spectroscopy

Background:

Reflection-mode grazing-incidence X-ray absorption spectroscopy (XAS) is a powerful surface-sensitive technique.
Accurate interpretation of XAS spectra from surfaces and thin films requires accounting for structural factors like roughness.
Existing models often simplify or neglect the impact of surface and interface irregularities.

Purpose of the Study:

To investigate the influence of surface and interface roughness on reflection-mode grazing-incidence X-ray absorption spectra.
To compare different theoretical models for calculating these spectra, considering roughness effects.
To demonstrate the practical implications of roughness on spectral analysis using experimental data.

Main Methods:

Simulations of Extended X-ray Absorption Fine Structure (EXAFS) spectra using Fresnel theory.
Comparison with the Névot-Croce model and distorted-wave Born approximation, incorporating roughness.
Analysis of experimental data from clean gold surfaces and oxidized copper samples.

Main Results:

Surface roughness significantly impacts reflection-mode XAS spectra, as demonstrated for gold surfaces.
Both outer surface and inner interface roughness affect spectra in multilayered systems.
Specular reflectivity profiles provide complementary information for data analysis.

Conclusions:

Surface and interface roughness are critical factors in reflection-mode grazing-incidence XAS.
Advanced models incorporating roughness are necessary for accurate spectral interpretation.
This work provides a framework for analyzing complex surface and thin-film systems.