Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
Infrared (IR) Spectroscopy: Overview01:09

Infrared (IR) Spectroscopy: Overview

When electromagnetic radiation passes through a material, atoms or molecules transition from a lower to a higher energy state by absorbing radiation corresponding to the energy difference between the two states. The absorption of infrared (IR) radiation causes transitions between vibrational energy levels in a molecule. Therefore, IR spectroscopy is a useful analytical tool for determining the molecular structure of molecules.
Different compounds display unique properties due to their...
Total Internal Reflection Fluorescence Microscopy01:05

Total Internal Reflection Fluorescence Microscopy

Total internal reflection fluorescence microscopy or TIRF is an advanced microscopic technique used to visualize fluorophores in samples close to a solid surface with a higher refractive index, such as a glass coverslip. TIRF only allows fluorophores in proximity to the solid surface to be excited. When light from a medium with a lower refractive index (such as air) hits the glass coverslip at a critical angle, the light undergoes total internal reflection stead of passing through the glass.
IR Frequency Region: Fingerprint Region01:03

IR Frequency Region: Fingerprint Region

IR spectra are divided into two main regions: the diagnostic region and the fingerprint region. The diagnostic region of the spectrum lies above 1500 cm−1. The absorptions resulting from single-bond vibrations of the N–H, C–H, and O–H stretch at higher wavenumbers and appear on the left side of the spectrum. The stretching absorptions of the C≡C and C≡N occur between 2100–2300 cm−1. In contrast, those arising from stretching absorptions of the C=O, C=N, and C=C occur between 1600–1850 cm−1.
The...

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Multimodal AFM-IR nanospectroscopy and non-linear optical microscopy for detecting collagen matrix alterations.

The Analyst·2026
Same author

Force Volume Atomic Force Microscopy-Infrared for Simultaneous Nanoscale Chemical and Mechanical Spectromicroscopy.

ACS nano·2025
Same author

Chemical Mapping of Supramolecular Self-Assembled Monolayers via Atomic Force Microscopy-Based Infrared with a Nanometer-Scale Lateral Resolution.

The journal of physical chemistry letters·2025
Same author

Nano-Investigation of Mineralized Biological Samples Chemical Composition: Experimental Challenges, Constraints, and Considerations.

Analytical chemistry·2025
Same author

Nanoscale Probing of the Organic Binder in Artists' Paint Layers: Organic Phases and Chemical Heterogeneity.

ACS applied materials & interfaces·2025
Same author

Single polyoxometalate-based nanoclusters characterized by infrared absorption nanospectroscopy.

Communications chemistry·2024
Same journal

Denoising algorithm of Φ-OTDR systems based on adaptive fractional wavelet transform denoising.

Optics express·2026
Same journal

Millisecond photon-to-photon latency and high-speed volumetric projection system for optogenetics.

Optics express·2026
Same journal

Polarization-encoded coaxial structured light for high-precision 3D surface profilometry.

Optics express·2026
Same journal

Discrete freeform optical design based on collaborative optimization of point cloud and local normals.

Optics express·2026
Same journal

Ultrafast ghost imaging with 25 GHz speckle switching and wavelength-division multiplexing.

Optics express·2026
Same journal

Atomic vapor cells fabricated by femtosecond laser welding of standard-optical-quality glass.

Optics express·2026
See all related articles

Related Experiment Video

Updated: Jun 22, 2026

Atomic Force Microscopy Combined with Infrared Spectroscopy as a Tool to Probe Single Bacterium Chemistry
08:51

Atomic Force Microscopy Combined with Infrared Spectroscopy as a Tool to Probe Single Bacterium Chemistry

Published on: September 15, 2020

Midinfrared absorption measured at a lambda/400 resolution with an atomic force microscope.

Julien Houel1, Estelle Homeyer, Sébastien Sauvage

  • 1Institut d'Electronique Fondamentale, CNRS-University Paris-Sud, Orsay, France.

Optics Express
|June 25, 2009
PubMed
Summary
This summary is machine-generated.

This study demonstrates local mid-infrared absorption measurement using an atomic force microscope combined with pulsed excitation. This technique achieves 50-nanometer spatial resolution for microdisk absorption analysis.

More Related Videos

Characterizing Individual Protein Aggregates by Infrared Nanospectroscopy and Atomic Force Microscopy
12:58

Characterizing Individual Protein Aggregates by Infrared Nanospectroscopy and Atomic Force Microscopy

Published on: September 12, 2019

High-definition Fourier Transform Infrared (FT-IR) Spectroscopic Imaging of Human Tissue Sections towards Improving Pathology
11:05

High-definition Fourier Transform Infrared (FT-IR) Spectroscopic Imaging of Human Tissue Sections towards Improving Pathology

Published on: January 21, 2015

Related Experiment Videos

Last Updated: Jun 22, 2026

Atomic Force Microscopy Combined with Infrared Spectroscopy as a Tool to Probe Single Bacterium Chemistry
08:51

Atomic Force Microscopy Combined with Infrared Spectroscopy as a Tool to Probe Single Bacterium Chemistry

Published on: September 15, 2020

Characterizing Individual Protein Aggregates by Infrared Nanospectroscopy and Atomic Force Microscopy
12:58

Characterizing Individual Protein Aggregates by Infrared Nanospectroscopy and Atomic Force Microscopy

Published on: September 12, 2019

High-definition Fourier Transform Infrared (FT-IR) Spectroscopic Imaging of Human Tissue Sections towards Improving Pathology
11:05

High-definition Fourier Transform Infrared (FT-IR) Spectroscopic Imaging of Human Tissue Sections towards Improving Pathology

Published on: January 21, 2015

Area of Science:

  • Materials Science
  • Spectroscopy
  • Nanotechnology

Background:

  • Local optical absorption measurements are crucial for material characterization.
  • Traditional methods often lack high spatial resolution.
  • Mid-infrared (MIR) spectroscopy provides unique information about molecular vibrations and material properties.

Purpose of the Study:

  • To develop and demonstrate a novel method for localized mid-infrared absorption measurement.
  • To achieve high spatial resolution in optical absorption analysis.
  • To investigate the MIR absorption of bulk GaAs and SiO(2) microdisks.

Main Methods:

  • Combining an atomic force microscope (AFM) with pulsed excitation for detection.
  • Utilizing cantilever oscillation amplitude as the signal.
  • Analyzing mid-infrared bulk GaAs phonon absorption.
  • Investigating mid-infrared absorption in thin SiO(2) microdisks.

Main Results:

  • The AFM cantilever oscillation amplitude signal correlates with the spectral dependence of bulk material absorption.
  • Achieved a spatial resolution of approximately 50 nanometers for microdisk absorption.
  • Demonstrated the capability of the technique for analyzing specific material absorptions (GaAs phonons, SiO(2) microdisks).

Conclusions:

  • The developed AFM-based technique enables localized mid-infrared absorption measurements with nanoscale resolution.
  • This method is effective for characterizing the optical absorption properties of materials at the micro- and nanoscale.
  • The findings open possibilities for advanced material analysis and device characterization.