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Microfluidic Chips for In Situ Crystal X-ray Diffraction and In Situ Dynamic Light Scattering for Serial Crystallography
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Observation of a bent crystal-lattice by x-ray interferometry

Enrico Massa1, Giovanni Mana, Luca Ferroglio

  • 1INRIM-Istituto Nazionale di Ricerca Metrologica, Torino, Italy. e.massa@inrim.it

Optics Express
|June 25, 2009
PubMed

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