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High-Throughput Total Internal Reflection Fluorescence and Direct Stochastic Optical Reconstruction Microscopy Using a Photonic Chip
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High-Throughput Total Internal Reflection Fluorescence and Direct Stochastic Optical Reconstruction Microscopy Using a Photonic Chip

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Ultrastable combined atomic force and total internal reflection fluorescence microscope [corrected]

H Gumpp1, S W Stahl, M Strackharn

  • 1Chair for Applied Physics and Center for NanoScience, Ludwig-Maximilians-University Munich, Amalienstr. 54, D-80799 Munich, Germany.

The Review of Scientific Instruments
|July 2, 2009
PubMed

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