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Atomic Force Microscopy

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

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Measuring the Mechanical Properties of Living Cells Using Atomic Force Microscopy

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Research on three dimensional machining effects using atomic force microscope.

Yao-Ting Mao¹, Kai-Chen Kuo, Ching-En Tseng

¹Department of Mechanical Engineering, National Taiwan University, Taipei 10617, Taiwan.

The Review of Scientific Instruments

|July 2, 2009

Summary

Researchers developed a novel nanomachining technique using an atomic force microscope (AFM) to create 3D nanoscale objects. This method controls debris for precise steric shaping, enabling the fabrication of nano-objects up to several hundred nanometers high.

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Micro-Mechanical Characterization of Lung Tissue Using Atomic Force Microscopy

Micro-Mechanical Characterization of Lung Tissue Using Atomic Force Microscopy

Published on: August 28, 2011

Area of Science:

Materials Science
Nanotechnology
Mechanical Engineering

Background:

Atomic Force Microscopy (AFM) is a powerful tool for nanoscale imaging and manipulation.
Conventional nanomachining processes face challenges with debris management, affecting precision and resolution.
Existing AFM systems require modification for advanced manufacturing applications.

Purpose of the Study:

To adapt a commercial AFM for 3D nanoscale object manufacturing.
To develop a debris management strategy for improved nanomachining.
To investigate a novel cutting and shaping algorithm for creating complex nano-architectures.

Main Methods:

Modification of a commercial AFM with a PC-based controller for multiaxis motion control.
Implementation of trajectory planning and various cutting strategies.
Development and application of a debris piling algorithm for steric shaping.

Main Results:

Successful fabrication of 3D nanoscale objects with heights up to a few hundred nanometers.
Demonstration of a piling algorithm that effectively manages and utilizes machining debris.
Identification of probe tip wear (approx. 500 microm diameter) as a limiting factor for machining resolution.

Conclusions:

The modified AFM system with a PC controller enables advanced nanomachining capabilities.
The developed piling algorithm offers a novel approach to debris management in nanomachining.
The technique shows promise for creating intricate 3D nanoscale structures, with vertical resolution under 10 nm in optimal conditions.