Electrostatic nanopatterning of PMMA by AFM charge writing for directed nano-assembly

Electrostatic nanopatterning of poly(methylmethacrylate) (PMMA) thin films by atomic force microscopy (AFM) charge writing was investigated using Kelvin force microscopy (KFM). The lateral size of the electrostatic patterns and the amount of injected charges are closely correlated and can be controlled by the height of the voltage pulses applied to the AFM tip and the tip-sample separation during the writing process. Charge retention measurements show that PMMA has excellent charge storage properties in air under relative humidities from 1% to 60% and withstands immersion in ultra-pure water. This study thus reveals that PMMA is a very promising electret to create efficient electrostatic nanopatterns for directed self-assembly of nanoscale objects, including the broad range of colloidal particles or molecules in aqueous solutions.