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Resonance Raman Spectroscopy of Extreme Nanowires and Other 1D Systems
Published on: April 28, 2016
Rigorous modal analysis of metallic nanowire chains
Amit Hochman1, Yehuda Leviatan
1Department of Electrical Engineering Technion - Israel Institute of Technology, Haifa 32000, Israel.
Optics Express
|August 6, 2009
Summary
A new Source-Model Technique (SMT) accurately analyzes nanowire chains (NCs). This rigorous method precisely calculates propagation constants for lossless and lossy structures, enabling detailed dispersion curve and mode profile determination.
Area of Science:
- Electromagnetics
- Condensed Matter Physics
- Materials Science
Background:
- Nanowire chains (NCs) are crucial components in advanced electronic and photonic devices.
- Accurate analysis of NC electromagnetic properties is essential for device optimization.
- Existing analytical methods may face limitations with complex or lossy structures.
Purpose of the Study:
- To introduce and validate a rigorous, full-wave Source-Model Technique (SMT) for analyzing nanowire chains (NCs).
- To demonstrate the capability of SMT in determining complex propagation constants for NC modes.
- To provide accurate dispersion curves and mode profiles for various NC configurations.
Main Methods:
- The study employs a rigorous, full-wave Source-Model Technique (SMT).
- A proper periodic Green's function is utilized, ensuring convergence for both lossless and lossy structures.
- Complex propagation constants are determined directly as solutions to a dispersion equation.
Main Results:
- The SMT successfully calculates the complex propagation constants of NC modes.
- Dispersion curves for several NCs were accurately computed.
- Mode profiles for the analyzed NCs were determined, showcasing the technique's utility.
Conclusions:
- The Source-Model Technique (SMT) offers a robust and accurate method for analyzing nanowire chains (NCs).
- The technique's ability to handle both lossless and lossy materials simplifies the analysis of complex nanostructures.
- This work provides a valuable tool for the design and simulation of NC-based devices.
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