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Source-model technique analysis of electromagnetic scattering by surface grooves and slits

Konstantin Trotskovsky1, Yehuda Leviatan

  • 1Department of Electrical Engineering, Technion–Israel Institute of Technology, Haifa 32000, Israel.

Journal of the Optical Society of America. A, Optics, Image Science, and Vision
|April 12, 2011
PubMed
Summary

A new computational tool analyzes electromagnetic wave scattering by surface grooves and slits efficiently. This source-model technique (SMT) offers faster solutions for complex scattering problems.

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